Memory soft error tester against alpha ray, neutron, etc.

The system detects the errors of IC memory against radioactive ray such as alpha, neutron, etc.
Accelerated test done by using relatively a little samples loaded close to the radiation source, or running test that detects soft errors in various environments while testing a large number of samples of several hundred or more continuously for a long time, may be configured.

After writing the data to the memory chip, soft error is detected by read back and compareed, periodically.
Change of written pattern, memory type, quantity, etc. may be supported by change of peripheral circuits and program.

Specifications example

• Pattern signal generator/Signal input:
  Signal I/O from 32cH TTL I/O Module/Unit
  Timing from Maximum 50MHz Timing controller module
• Bias Supply (3 supplies): Core Supply, I/O Supply and Circuit Supply
• Error detection and record: Maximum 64K Data
• # of Test Devicse: Maximum 1024 (4 Unit)
• Test Board: 32 DUT's/Board
• Software: GP-IB Control from PC