- DC to 25 MHz Data Rates.
- Stimulus/Response/Real-Time Compare/Record.
- Up to 96 Inputs and 96 Outputs in a single Dual-Slot Module. Expandable to 576 Inputs and 576 Outputs.
- 64K or 256K Vectors per Channel.
- RAM-Backed and Algorithmic Pattern Generation.
- Data Formatting with Programmable Edge Placement.
- Conditional Pattern Looping and Branching for Real time Test Sequence Control.
- A32/D32 Binary Transfer for High-Speed Test Program Download.
- Multiple Logic Families Supported, TTL, ECL, Variable Voltage, CMOS.
- Guided Probe Capability.
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- DC to 50 MHz Data Rates.
- Stimulus/Response/Real-Time Compare/Record.
- 16-32 I/O Channels per Module. Expandable to 640 Inputs and 640 Outputs.
- 64K Vectors per Channel.
- RAM-Backed and Algorithmic Pattern Generation.
- Data Formatting with 100 ps Programmable Edge Placement.
- Multi-Level Triggering and Advanced Logic Analysis.
- Conditional Pattern Looping and Branching for Real time Test Sequence Control.
- A32/D32 Binary Transfer for High-Speed Test Program Download.
- Multiple Logic Families Supported With Separate VXI Modules.
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- DC to 50 MHz Data Rates.
- Stimulus/Response/Real-Time Compare/Record.
- 32 Differental ECL Input, Output and Tristate Channels per Module.
- 256K or 1 M Vectors per Channel.
- RAM-Backed and Algorithmic Pattern Generation.
- NRZ, RZ, RONE, RTC, and RINH Data Formats.
- 100 ps Edge Placement Resolution.
- Ideally Suited for Both Unit and Component Testing.
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