As digital hardware becomes increasingly more complex, so too does the test instrumentation needed to verify its performance. The high-performance VXI plug&play digital testers from Interface Technology (SR2500, SR5000, SR5500) are specifically designed to handle the growing complexity of testing today's digital hardware. And now, with the availability of ITI's GWIN and WIN VXI plug&play software drivers, the task of programming and running digital test routines with the these high performance digital testers has been reduced to a few easy "point-and-click" menu selections.
The GWIN and WIN Plug&Play drivers run under National Instruments' LabVIEW and LabWindows/CVI graphical programming language and provide more than 100 interactive screens to provide micro-management of virtually any digital test application. These fully functional Soft Panels allow interactive control of test development and debug operations to be performed in an easy, straight forward manner. The GWIN and WIN VXI Plug&Play drivers are supplied FREE with the purchase of any SR2500, SR5000, or SR5500 Digital Test subsystem. As with LabVIEW and LabWindows/CVI, our software drivers work under Windows 95/98 or NT operating platforms.
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The LP5000 converts Teradyne LASAR logic simulation, fault simulation, and guided probe data into test programs for use by Interface Technology SR5000, SR5500, or SR2500 VXI Digital Test Subsystems(ITDTS), and the associated runtime controls for loading and executing test programs. The LP5000 was developed specifically as a direct LASAR to ITDTS link, and takes full advantage of all of the high speed timing, pin formatting, and programmable features of these instruments. The software is available as Microsoft Windows 95/NT DLLs, which may be called from other Windows applications, such as a test executive. As such, the user interface consists of graphical icons, buttons, and displays to simplify the operations of post processing test data, running tests on a UUT, reporting failures back to the operator, and performing various diagnostric routines on a failed UUT.
- Conversion of LSRTAP files into Digital Test Programs.
- Compatible with SR5000, SR5500, and SR2500 Digital Test Subsystem.
- Graphical User Interface.
- Post Processor for Simulation Vectors, Fault Dictionary, and Guided Probe Nodal Data.
- Perform GO/NOGO Testing, Fault Dictionary Fault Isolation Testing, and Guided Probe Fault Isolation Testing.
- WIN Framework VXI Plug&Play Interface.
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