These are the reliability test systems for evaluating ESD, Latch-Up, CDM and TLP.

Test & Measurement Technology

Featuring ESD, CDM and Latch-up test, Our company support every electrostatic destruction tester as well as test head.

Full Automatic ESD, CDM and Latch-up Test System

    High-pin-count Tester
    Photo
    Pin
    matrix
    Max
    voltage
    Vcc
    Test
    Model
    int
    ext
    ESD
    CDM
    L-UP
    Measure
    Use
    MODEL 7000X
    1024
    (2048)
    8000V
    6
    4
    OK
    -
    OK
    OK
    High-pin-count
    IC
    MODEL 7000B
    512
    (1024)
    MODEL 7600L
    512
    -
    4
    -
    -
    -
    OK
    OK
    MODEL 7500
    128
    8000V
    4
    8
    OK
    -
    -
    OK
    Low-pin-count
    IC
    OK
    MODEL CDM550
    -
    4000V
    -
    -
    -
    OK
    -
    -
    IC
    LSI
    512
    4
    4
    OK

    ESD / CDM / Latch-up Tester
    Photo
    Pin
    matrix
    Max
    voltage
    Vcc
    Test
    Model
    int
    ext
    ESD
    CDM
    L-UP
    Measure
    Use
    全自動ESDステーション
    -
    ESD 8000V
    CDM 4000V
    -
    -
    OK
    OK
    -
    OK
    Electronics
    Parts
    全自動ESDステーション
    128
    (256)
    6
    OK
    IC
    LSI

ESD/CDM/TLP Simulator

TLP Tester

  • Model 4002/4012 Model 4002/4012
    * Model 4002 is the first TLP test system in the world.
    * Damage detection by leakage current measurement after each pulse
    * Pulse Rise Time: 0.2ns, 2ns and 10ns(4002) /0.1ns, 0.2ns and 0.4ns(4012)

CMR Tester

  • Model 6200 Model 6200
    * High Voltage DV/DT Generator
    * Pulse voltage (DT): +/- 500V~2kV
    * Select of DV/DT: 1kV/us, 5kV/us, 10kV/us, 20kV/us, 30kV/us