[Multi-test type] ESD/CDM/LATCH-UP | ESD Testing Station 1200 series

Test & Measurement Technology

ESD/CDM/LATCH-UP Test Methods
ESD Station 1200 series

1200E : MM, HBM
1200EL : MM, HBM, LATCH-UP
1200ELC : MM, HBM, CDM, LATCH-UP
ESD Station [Model 1200]

Model 1200 series allows world's first ESD/CDM/LATCH-UP tester by one systeml. Stable and efficient test is expected with fully programmable pin combination ESD test up to 256 pins devices.
The biggest feature is the very wide work area. This enables ESD/CDM stressing to the complicated semiconductor device, PC board assembly and a modular product. If aplication specific DUT board is made, evaluation of from LED to very high pin count device can be done.

Features/Functions

  • Meets every standard such as MIL, EIA/JEDEC, EIAJ, AEC and ESDA
  • 4 functions, HBM, MM, CDM and LATCH-UP tests by 1 system
  • Maximum voltage up to 8kV
  • Maximum zapping point up to 1500
  • V-I cucrve can be monitored on PC monitory during ESD test
  • ESD may meet customer or application specific waveform including immunity test
  • Internal CCD camera (Opition) allows the contact to very small devices
  • Up to 125 degree-C latch-up test available by optional high temp. oven
  • Latch-up waveform detected by an optional digital scope
  • Remote programming, control and data log possible by LAN connection
  • Easy maintenance by ESD waveform diagnosis and system diagnosis
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