[Full automatic High-Pin-Count] ESD/LATCH-UP Test System | Model 7000X

HBM and MM test are the major ESD test for the semiconductor reliability. Also, the latch-up test may not be avoided on the CMOS devices. M7000 series is the system to support these requirements to meet world wide standards.

Features and Functions

• Meeting MIL,EIA/JEDEC,JEITA,AEC,ESDA standards
• System pin count up to 1024 pins
• Max DC current of system pin:4A
• Up to 10 DUTs on a DUT board tested
• Diagnostics of the system and waveform
• Optional 5 years warranty
• Safety functions

ESD Functions

• 8kV HBM Max
• High Speed Zapping Mode available
• Various PIn Combination test
• Damage Detection by high precision V/I meter
• High Speed damage detection (Option)

Latch-up test functions

• Uo to 6 Latch-up Detection supplies
• 3 supplies for the Max-Hi/Min-Low and Vector pattern included
• Additional external supplies (Option)
• 155℃ Latch-up test head available (Option)